Center for Materials and Sensor Characterization

Veeco Nanoscope IIIA Multimode Atomic Force Microscope

afmThe Veeco Multimode Nanoscope IIIa AFM has a resolution of ~ 0.3 nm with A scanner. The instrument is capable of imaging areas ~ 1 sq. µm (using the standard A scanner), ~12 sq. µm. (using vertical engagement EV scanner) and ~125 sq. µm (using vertical engagement JV scanner) in the XY direction. The scanning range in the Z direction for EV and JV scanner are ~ 2 µm and ~ 5 µm respectively. The AFM is capable of imaging in Contact mode and Tapping mode with Nanoindentation capabilities. Attachments include a Fluid Cell for imaging in liquids (Contact and Tapping mode) and an Anti-vibration suspension mount for atomic resolution imaging. A 15 mm sample disc is used to mount the samples with access to ~ 2-3 mm area at the center of the sample.

Last Updated: 6/27/22