Veeco Nanoscope IIIA Multimode Atomic Force Microscope
The Veeco Multimode Nanoscope IIIa AFM has a resolution of ~ 0.3 nm with A scanner.
The instrument is capable of imaging areas ~ 1 sq. µm (using the standard A scanner),
~12 sq. µm. (using vertical engagement EV scanner) and ~125 sq. µm (using vertical
engagement JV scanner) in the XY direction. The scanning range in the Z direction
for EV and JV scanner are ~ 2 µm and ~ 5 µm respectively. The AFM is capable of imaging
in Contact mode and Tapping mode with Nanoindentation capabilities. Attachments include
a Fluid Cell for imaging in liquids (Contact and Tapping mode) and an Anti-vibration
suspension mount for atomic resolution imaging. A 15 mm sample disc is used to mount
the samples with access to ~ 2-3 mm area at the center of the sample.