Instruments
Microscopy
- FEI Quanta 3D FEG Environmental Scanning Electron Microscope and Focused Ion Beam
- Hitachi HD-2300A Scanning Transmission Electron Microscope
- Hitachi S-4800 UHR Scanning Electron Microscope
- Veeco Nanoscope IIIa Multimode Scanning Probe Microscope
- Keyence VHX-600 Digital Microscope
Thermal Analysis
- TA Instruments Q50 Thermogravimetric Analyzer (TGA)
- TA Instruments Q800 Dynamic Mechanical Analyzer (DMA)
- TA Instruments DCS 250
sPECTROSCOPY
- PerkinElmer FTIR/NIR Frontier Spectrometer coupled with Spotlight imaging system with array detector
- Varian Excalibur Series Fourier Transform Infrared (FTIR) instruments, the FTS-4000 Spectrometer and the UMA-600 Microscope
- Jobin Yvon Horiba Confocal Raman Spectrometer
- Bruker FT Raman Spectrometer with Microscope
- Thermo Scientific XSeries2 Inductively Coupled Plasma-Mass Spectrometer (ICP-MS)
- SensiQ SPR spectrometer
- UV/Vis Spectrophotometer
oTHER Characterization EQUIPMENT
- Rigaku Ultima III X-ray Diffractometer with Small Angle X-ray Scattering (SAXS)
- Mars 230/60 Microwave system
- Micromeritics ASAP 2020 Accelerated Surface Area & Porosimetry System
- Micromeritics AccuPyc 1330 Gas Pycnometer
- Varian 320-MS Quadrupole LC-MS with Auto Sampler
- YSI 2300 STAT PLUS Glucose and Lactate Analyzer
- Tantec Model CAM-MICRO Contact Angle Meter
- Gamry Instruments Reference 600 Potentiostat
Instruments to support analyses, such as sputter coater, critical point dryer, ultramicrotome, precision saw, polisher and fluorescent microscopes are also available.
All instruments are located at:
Center for Materials and Sensor Characterization
The University of Toledo, Main Campus
Rooms 1496,1479,1477A North Engineering Bldg