Center for Materials and Sensor Characterization

Hitachi HD-2300 Scanning Transmission Electron Microscope

hd2300The Hitachi HD-2300 is a high throughput dedicated STEM with an accelerating voltage of 200 kV. This second-generation STEM has superior performance and enhanced user interface designed for quick, comprehensive sample evaluation, with unmatched analytical capabilities and consistent high-end performance. Its features make it an essential tool for Nanotechnology applications. The features include:

  • Quick specimen exchange within 2 minutes and high voltage application in 3 minutes (standby condition to 200kV on)
  • Automated column alignment and image viewing functions
  • High resolution STEM and SEM imaging
  • Nano-area electron diffraction with simultaneous display of STEM image

Technical Specifications

Crystal lattice resolution

0.203 nm guaranteed (Magnification: x4,000,000)

Accelerating voltage

200 kV

Magnification range

x100 ˜ x10,000,000 (for observation)
x100 ˜ x5,000,000(for saving)

Electron optics

Schottky emission electron source with built-in anode heater

Imaging mode

Phase contract image (TE image), Z-contrast image (ZC image), Secondary electron image (SE image)

Specimen stage

Side-entry system
X = ±1mm, Y = ±1mm, T= ±30o, Z = ±0.3mm

Last Updated: 6/27/22