Center for Materials and Sensor Characterization

X-ray Diffractometer with Small Angle X-ray Scattering (SAXS)

xrdThe Rigaku Ultima III high resolution X-ray diffraction (XRD) instrument is used for various applications such as in-plane and normal geometry phase identification, quantitative analysis, lattice parameter refinement, crystallite size determination and depth-controlled phase identification. In addition to standard Bragg Brentano geometries, the system is capable of grazing incidence diffraction (GIXRD), transmissive and reflective small-angle X-ray scattering (SAXS).

Instrument Specifications:

  • Generator: Cu target with a rated tube voltage of 20-60KV operated at 40KV and 44 mA
  • Detector: Scintillation Counter detector
  • Goniometer: In plane arm with a radius of 285 mm; scanning modes of theta S, theta d and theta S/theta d coupled are available with a minimum step size of 0.0001 degrees
  • Optics: Automatic alignment of tube height, goniometer, optics and detector. The Divergence, Scattering and Receiving slits are fixed or auto variable. Soller slits - incident beam and diffracted beam 0.5 and 5 degrees
  • Accessories: Monochromator and Transmission SAXS holder and softwares such as Jade v8.0, Nano-Sovler v3.4 are also available
  • The TGA is used to measure properties such as thermal stability of materials, oxidative stability of materials, composition of multi-component systems, estimated lifetime of a product, decomposition kinetics of materials, moisture and volatile contents for materials.
Last Updated: 6/27/22