Center for Materials and Sensor Characterization

PerkinElmer FTIR/NIR Frontier Spectrometer Coupled with Spotlight Imaging System with Array Detector

peftirFrontier spectrometer is powerful and adaptable spectrometer that offers superior quality in the near and middle infrared region. Frontier can support extensive IR analysis using a single instrument by simply switching the sampling accessories.

The same interferometer platform also powers the Spotlight imaging system. The spotlight is a high performance FT-IR microscopy and FT/IR/NIR imaging system. This system reveals the identity of a vast array of chemical components within materials, as well as displaying areas of homogeneity and variation. Also, the imaging system has the option for transmission and reflection micro-sampling.Its Micro-ATR provides information down to areas as small as 3 microns.

This can be used for various applications such as troubleshooting manufacturing problems, identify product contaminants, confirm quality of materials, study advance material properties, develop new products, pharmaceuticals, biological tissues, packaging materials, coatings, electronic materials, reverse engineering, and laminated layers identification.

Last Updated: 6/27/22