microscopy

super resolution microscope

Nikon N-STORM Super Resolution Microscope & FRET

• Stochastic optical reconstruction microscopy
• Lateral resolution of ~20 nm
• Axial resolution of ~50 nm
• Multi-color imaging capability
• High definition, high density images
• NIS-Elements Software
  • Multi-channel images
  • Time lapse
  • Multipoint functionality
  • Image stitching
  • Multidimensional image display
  • 2D/3D Deconvolution

• FRET (Fluorescence (Förster) Resonance Energy Transfer) capabilities

Contact: Dr. Christopher G. Gianopoulos

scanning electron microscopy (SEM)

JEOL JSM-7500F with EDS Detector Attachment

 

• Cold Cathode Field Emission Microscope
• Analyses samples up to dia. = 200 mm x height = 10 mm
• Various detectors, including:
  • LABE - STEM - EBIC - EDS  
• Cyber Enabled
• EDS attachment can be used for elemental mapping
• For an introduction to EDS theory and considerations for sample analysis see this video from the CMSC
• Gold and Carbon specimen coating available 
• Typical Operations Manual can be found here
• A Guide to Scanning Microscope Observation can be found here
• Here is an informative video about choosing the right SEM parameters: https://youtu.be/eOyfoMRHfgE
• All samples must be completely dried before being placed in the SEM.

If you need help, please contact Dr. Kristen Kirschbaum

*Image above taken on our instrument of diatom

   stereoscopic light microscope 

Olympus SZX7

 

• Olympus SC100 camera directly attached
• Digital imaging
• Live video recording
• Images and measurements can be taken and viewed via a computer

Here are the manuals for the Microscope and Illuminator Stand and a short Video explaining the proper setup. 

Contact: Dr. Kristin Kirschbaum