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Equipement Set I
Here are some other equipment in PVIC labs.
- Dektak 150 (Profilometer)
- 4-Point Probe (Sheet Resistant)
- Solar Simulator (IV Curve System)
- External Quantum Efficiency (EQE) System
- UV-VIS-NIR Spectrophotometer (Lamda 1050)
Dektak 150 (Profilometer)
A profilometer measures the vertical depth of a material across a horizontal length. A diamond stylus is transverse laterally across the sample with a specified distance and contact force. The stylus moves vertically with the surface variations, and the displacement can be measured as a function of position. This equipment can be employed to measure etch depth, deposited film thickness, and surface roughness.
4-Point Probe (Sheet Resistant)
4-point probe measures the sheet resistance of a thin film. It is an electrical impedance measuring technique that has a pair of current-carrying (driving force) and voltage-sensing (sensing) contacts that is more accurate than the traditional two terminal methods, because it eliminates the impedance contribution of the wiring and the contact resistances. A current is supplied by a pair of force connections, and a pair of sense connections.
Solar Simulator (IV Curve System)
Our solar simulator is a Class A Solar Simulator, so it maintains a exceptionally tight uniformity, output stability, and spectral match. The solar simulator provides repeatable light conditions, equal to “one sun”. The device uses a xenon arc lamp with an ellipsoidal mirror, filtering, and beam collimation. The cell (or diode) is connected to a multi-meter and a voltage sweep occurs. That is then plotted verses the current produced.
External Quantum Efficiency (EQE) System
External Quantum Efficiency (EQE) is known as the ratio of the number of photons (of a given energy shining on the solar cell) to the number of charge carriers collected. It reports the response of a photovoltaic cell to the precise wavelengths in the spectrum of light shining on the cell. For example, if all of the photons of a certain wavelength were collected, the quantum efficiency would be 100%.
UV-VIS-NIR Spectrophotometer (Lamda 1050)
The Spectrophotometer uses a photometer to measure the intensity of light as a function of the source wavelength.It evaluates the sample with visible light, near-ultraviolet, and near-infrared (or any combination) and ranges for 190nm to 3300nm. Our double beam spectrophotometer compares the light intensity between two paths (one as a reference and the other the test). It measures the transmission of light through a sample, reflection off of the sample (diffuse and specular), and pseudo absorption.
